X-ray Fluorescence
X-ray fluorescence (XRF) is a non-destructive analytical technique used to determine the elemental composition of materials. It operates on the principle that when a material is exposed to high-energy X-rays or gamma rays, it emits secondary, or fluorescent, X-rays at energies characteristic of the elements present. This makes XRF a powerful method for chemical analysis, particularly in metallurgy, geochemistry, forensics, and art conservation.
XRF systems consist of a primary radiation source (commonly X-ray tubes or radioactive isotopes), a sample positioning mechanism, and a detector that measures the energy and intensity of the emitted X-rays. There are two main types of XRF analyzers: energy-dispersive (EDXRF), which sort photons by energy, and wavelength-dispersive (WDXRF), which sort by wavelength using diffraction crystals. EDXRF analyzers are often portable and used in field applications, while WDXRF systems are more precise and used in laboratories.
Modern advancements have enabled compact handheld XRF analyzers and integration with automated systems. Applications include quality control in manufacturing, mineral and soil analysis, coating thickness measurement, and detection of hazardous substances. XRF's ability to rapidly analyze multiple elements simultaneously with minimal sample preparation has made it indispensable in both industrial and research settings.
